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Depositordc.contributorBlair, Ewen
Funderdc.contributor.otherEPSRC - Engineering and Physical Sciences Research Councilen_UK
Data Creatordc.creatorBlair, Ewen O
Data Creatordc.creatorCorrigan, Damien K
Data Creatordc.creatorLevene, Hannah
Data Creatordc.creatorSchmueser, Ilka
Data Creatordc.creatorTerry, Jonathon G
Data Creatordc.creatorSmith, Stewart
Data Creatordc.creatorMount, Andrew R
Data Creatordc.creatorWalton, Anthony J
Date Accessioneddc.date.accessioned2017-05-02T15:09:32Z
Date Availabledc.date.available2017-05-02T15:09:32Z
Citationdc.identifier.citationBlair, Ewen O; Corrigan, Damien K; Levene, Hannah; Schmueser, Ilka; Terry, Jonathon G; Smith, Stewart; Mount, Andrew R; Walton, Anthony J. (2017). Improving the Yield and Lifetime of Microfabricated Sensors for Harsh Environments, [dataset]. University of Edinburgh. School of Engineering. Institute of Micro and Nano Systems. https://doi.org/10.7488/ds/2004.en
Persistent Identifierdc.identifier.urihttp://hdl.handle.net/10283/2667
Persistent Identifierdc.identifier.urihttps://doi.org/10.7488/ds/2004
Dataset Description (abstract)dc.description.abstractThis dataset is a companion to the paper, "Improving the Yield and Lifetime of Microfabricated Sensors for Harsh Environments". This details several methods of increasing the robustness of microfabricated microelectrodes for use in the molten salt LKE at 450 degrees Celsius. The dataset includes: (a) Yield statistics for two different microelectrode layouts (IML and RCA), which comprise the number of working and failed electrodes for each design. (b) Measurements to determine the lifetime of the IML and RCA electrodes. These measurements were of the reduction and oxidation of AgCl. The measurements were made consecutively until the device failed, and each is stored as a separate text file of applied potential vs measured current. (c) Experiments performed using test structures, where the potential was held steady and the current monitored for 15 minutes. Each set of measurements are stored as a .csv file, which contains three experiments per size of test structure for four test structures.en_UK
Dataset Description (TOC)dc.description.tableofcontentsThe dataset contains 5 zip files and a readme.txt file The zip files are: Figure 3 - IML lifetimes Contains the lifetime data for figure 3. There are 6 subfolders, each for a separate IML device's lifetime experiment. The data for the lifetime experiments are either .csv (which can be opened as text file) or .txt. There is also a readme file. Figure 5 - RCA lifetimes Contains the lifetime data for figure 5. There are 9 subfolders, each for a separate RCA device's lifetime experiment. The data for the lifetime experiments are either .csv (which can be opened as text file) or .txt. There is also a readme file. Figure 8 - Test structure average currents This folder contains the data for the test structure measurements presented in figure 8 as a .csv file, and a readme file. Figure 9 - Test structure individual currents This folder contains the data for the test structure measurements presented in figure 9 as a .csv file, and a readme file. Yield Numbers This folder contains the yield statistics quoted in the paper, with the number of working and failed electrodes of each layout in a .csv file.en_UK
Languagedc.language.isoengen_UK
Publisherdc.publisherUniversity of Edinburgh. School of Engineering. Institute of Micro and Nano Systemsen_UK
Relation (Is Referenced By)dc.relation.isreferencedbyBlair, EO et al "Improving the Yield and Lifetime of Microfabricated Sensors for Harsh Environments" (Accepted)en_UK
Supersedesdc.relation.replaceshttps://doi.org/10.7488/ds/1336en_UK
Rightsdc.rightsCreative Commons Attribution 4.0 International Public Licenseen
Subjectdc.subjectMicrofabricationen_UK
Subjectdc.subjectMicroelectrodesen_UK
Subjectdc.subjectHarsh Environmenten_UK
Subjectdc.subjectMolten Salten_UK
Subjectdc.subjectYielden_UK
Subjectdc.subjectLifetimeen_UK
Subjectdc.subjectTest Structuresen_UK
Subject Classificationdc.subject.classificationEngineeringen_UK
Titledc.titleImproving the Yield and Lifetime of Microfabricated Sensors for Harsh Environmentsen_UK
Typedc.typedataseten_UK

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