Improving the Yield and Lifetime of Microfabricated Sensors for Harsh Environments
Data CreatorBlair, Ewen O
Corrigan, Damien K
Terry, Jonathon G
Mount, Andrew R
Walton, Anthony J
PublisherUniversity of Edinburgh. School of Engineering. Institute of Micro and Nano Systems
MetadataShow full item record
CitationBlair, Ewen O; Corrigan, Damien K; Levene, Hannah; Schmueser, Ilka; Terry, Jonathon G; Smith, Stewart; Mount, Andrew R; Walton, Anthony J. (2017). Improving the Yield and Lifetime of Microfabricated Sensors for Harsh Environments, [dataset]. University of Edinburgh. School of Engineering. Institute of Micro and Nano Systems. http://dx.doi.org/10.7488/ds/2004.
DescriptionThis dataset is a companion to the paper, "Improving the Yield and Lifetime of Microfabricated Sensors for Harsh Environments". This details several methods of increasing the robustness of microfabricated microelectrodes for use in the molten salt LKE at 450 degrees Celsius. The dataset includes: (a) Yield statistics for two different microelectrode layouts (IML and RCA), which comprise the number of working and failed electrodes for each design. (b) Measurements to determine the lifetime of the IML and RCA electrodes. These measurements were of the reduction and oxidation of AgCl. The measurements were made consecutively until the device failed, and each is stored as a separate text file of applied potential vs measured current. (c) Experiments performed using test structures, where the potential was held steady and the current monitored for 15 minutes. Each set of measurements are stored as a .csv file, which contains three experiments per size of test structure for four test structures.
The individual measurements for each lifetime experiment of the IMLs. These are in the form of CVs (applied potential vs measured current) (25.48Mb)
The individual measurements for each lifetime experiment for the RCAs. These are in the form of CVs (applied potential vs measured current) (517.1Mb)