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Depositordc.contributorWalton, Anthony
Funderdc.contributor.otherEPSRC - Engineering and Physical Sciences Research Councilen_UK
Data Creatordc.creatorMurray, Jeremy
Date Accessioneddc.date.accessioned2016-02-08T10:37:44Z
Date Availabledc.date.available2016-04-01T04:15:23Z
Citationdc.identifier.citationMurray, Jeremy. (2016). Data for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures", [dataset]. University of Edinburgh, School of Engineering. https://doi.org/10.7488/ds/1337.en
Persistent Identifierdc.identifier.urihttp://hdl.handle.net/10283/1915
Persistent Identifierdc.identifier.urihttps://doi.org/10.7488/ds/1337
Languagedc.language.isoengen_UK
Publisherdc.publisherUniversity of Edinburgh, School of Engineeringen_UK
Relation (Is Referenced By)dc.relation.isreferencedbyPaper "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures" has been submitted for a presentation at this conference: IEEE International Conference on Microelectronic Test Strucures 2016, which will take place in Yokohama, Japan in March 28-31 2016.en_UK
Rightsdc.rightsCreative Commons Attribution 4.0 International Public Licenseen
Titledc.titleData for "Chip level characterisation studies of Ni and NiFe electrochemical deposition using test structures"en_UK
Typedc.typedataseten_UK

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